![](/img/cover-not-exists.png)
[IEEE 2014 IEEE 23rd North Atlantic Test Workshop (NATW) - Johnson City, NY, USA (2014.5.14-2014.5.16)] 2014 IEEE 23rd North Atlantic Test Workshop - A New Test Vector Search Algorithm for a Single Stuck-at Fault Using Probabilistic Correlation
Venkatasubramanian, Muralidharan, Agrawal, Vishwani D.Year:
2014
Language:
english
DOI:
10.1109/natw.2014.20
File:
PDF, 247 KB
english, 2014