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[IEEE 2008 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (MEMS/MOEMS) - Nice, France (2008.04.9-2008.04.11)] 2008 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS - Noise-based optimization and noise analysis for resonant MEMS structures
Sharma, Mrigank, Kannan, Akila, Cretu, EdmondYear:
2008
Language:
english
DOI:
10.1109/dtip.2008.4752958
File:
PDF, 4.17 MB
english, 2008