[IEEE Networks (DSN) - Chicago, IL, USA (2010.06.28-2010.07.1)] 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN) - Measurement-based analysis of fault and error sensitivities of dynamic memory
Yim, Keun Soo, Kalbarczyk, Zbigniew, Iyer, Ravishankar K.Year:
2010
Language:
english
DOI:
10.1109/dsn.2010.5544287
File:
PDF, 853 KB
english, 2010