[IEEE 2010 IEEE Workshop on Microelectronics and Electron...

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[IEEE 2010 IEEE Workshop on Microelectronics and Electron Devices (WMED) - Boise, ID, USA (2010.04.16-2010.04.16)] 2010 IEEE Workshop on Microelectronics and Electron Devices - A Comprehensive Study on Nanomechanical Properties of Various SiO2-Based Dielectric Films

Wei, Guohua, Varghese, Sony, Beaman, Kevin, Vasilyeva, Irina, Mendiola, Tom, Carswell, Andrew, Fillmore, David, Lu, Shifeng
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Year:
2010
Language:
english
DOI:
10.1109/wmed.2010.5453755
File:
PDF, 421 KB
english, 2010
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