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[IEEE 2010 International Conference on Nanoscience and Nanotechnology (ICONN) - Sydney, Australia (2010.02.22-2010.02.26)] 2010 International Conference on Nanoscience and Nanotechnology - Deep level transient spectroscopy study of defects at Si/SiO2 and Si/Si3N4 interfaces
Johnson, B. C., Rahman, H. U., Gauja, E., Ramer, R., McCallum, J. C.Year:
2010
Language:
english
DOI:
10.1109/iconn.2010.6045257
File:
PDF, 1.94 MB
english, 2010