Nano- and meso-measurement methods in the study of dielectrics
Stevens, G.C., Baird, P.J.Volume:
12
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/tdei.2005.1522191
Date:
October, 2005
File:
PDF, 757 KB
english, 2005