[IEEE Technical Papers. International Symposium on VLSI Technology, Systems, and Applications - Taipei, Taiwan (June 3-5, 1997)] Proceedings of Technical Papers. International Symposium on VLSI Technology, Systems, and Applications - A Shallow-'ikench Isolation Study For 0.18pm Cmos Technology With Emphasis On The Effects Of Well Design, Channel-stop Implants, Trenchl Depth, And Salicide Process
Murtaza, S.S., Chatterjee, A., Mei, P., Amerasekera, A., Nicollian, P., Kittl, J., Breedijk, T., Hanratty, M., Nag, S., Ali, I., Rogers, D., Chen, I.-C.Year:
1997
Language:
english
DOI:
10.1109/vtsa.1997.614744
File:
PDF, 366 KB
english, 1997