Noise sources across a normal-to-superconducting boundary...

IEEE Electron Device Letters 1990 / 05 Vol. 11; Iss. 5

Noise sources across a normal-to-superconducting boundary in bulk YBa/sub 2/Cu/sub 3/O/sub 7-x/

Fang, P., Hall, J., Chen, T.M., Dekker, A.J., Van der Ziel, A.
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Volume:
11
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.55253
Date:
May, 1990
File:
PDF, 294 KB
english, 1990
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