Dependence of Interface State Density on Silicon Thermal...

Dependence of Interface State Density on Silicon Thermal Oxidation Process Variables

Razouk, Reda R.
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Volume:
126
Year:
1979
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.2129333
File:
PDF, 1.15 MB
english, 1979
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