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[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Novel Ultra-Low Voltage and High-Speed Programming/Erasing Schemes for SONOS Flash Memory with Excellent Data Retention
Chung, Steve S., Tseng, Y. H., Lai, C. S., Hsu, Y. Y., Ho, Eric, Chen, Terry, Peng, L. C., Chu, C. H.Year:
2007
Language:
english
DOI:
10.1109/iedm.2007.4418972
File:
PDF, 2.10 MB
english, 2007