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[IEEE 64th ARFTG Microwave Measurements Conference, Fall 2004. - Orlando, FL, USA (Dec. 2-3, 2004)] 64th ARFTG Microwave Measurements Conference, Fall 2004. - A non-contacting sampled-line reflectometer for microwave scattering parameter measurements
Hui, D., Weikle, R.M.Year:
2004
Language:
english
DOI:
10.1109/arftgf.2004.1427585
File:
PDF, 877 KB
english, 2004