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[IEEE 2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2009.03.15-2009.03.19)] 2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Adaptive multiple cooling surfaces Compact Thermal Model (CTM), and boundary condition independent multiple heat sources CTM
Tounsi, Patrick, Sauveplane, Jean-Baptiste, Nowakowski, Jerzy Piotr, Madrid, Francesc, Jean-Marie-Dorkel,Year:
2009
Language:
english
DOI:
10.1109/stherm.2009.4810769
File:
PDF, 1.23 MB
english, 2009