[IEEE 2009 20th International Zurich Symposium on Electromagnetic Compatibility - Zurich, Switzerland (2009.01.12-2009.01.16)] 2009 20th International Zurich Symposium on Electromagnetic Compatibility - ESD Current Spread Measurement Using Mesh Structure
Lim, Jae-Deok, Pommerenke, David, Lee, Jong-Sung, Seol, Byong-SuYear:
2009
Language:
english
DOI:
10.1109/emczur.2009.4783441
File:
PDF, 473 KB
english, 2009