![](/img/cover-not-exists.png)
[IEEE Technology (ICICDT) - Grenoble (2010.06.2-2010.06.4)] 2010 IEEE International Conference on Integrated Circuit Design and Technology - Impact of resistance drift on multilevel PCM design
Yi-Hsuan Chiu,, Yi-Bo Liao,, Meng-Hsueh Chiang,, Chia-Long Lin,, Wei-Chou Hsu,, Pei-Chia Chiang,, Yen-Ya Hsu,, Wen-Hsing Liu,, Shyh-Shyuan Sheu,, Keng-Li Su,, Ming-Jer Kao,, Ming-Jinn Tsai,Year:
2010
Language:
english
DOI:
10.1109/icicdt.2010.5510298
File:
PDF, 677 KB
english, 2010