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[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - New method for electrothermal simulations: HDTMOS in automotive applications
Tounsi, P., Dorkel, J.M., Dupuy, P., Chauffleur, X., Fradin, J.P., Feybesse, A., Chaunut, F.Year:
2004
Language:
english
DOI:
10.1109/stherm.2004.1291310
File:
PDF, 465 KB
english, 2004