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[IEEE 2011 International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - Modeling and analyzing NBTI in the presence of Process Variation
Siddiqua, Taniya, Gurumurthi, Sudhanva, Stan, Mircea R.Year:
2011
Language:
english
DOI:
10.1109/isqed.2011.5770699
File:
PDF, 237 KB
english, 2011