[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - First test of the charge state breeder
Variale, V., Valentino, V., Boggia, A., Brautti, G., Clauser, T., Raino, A., Bak, P., Boimelshtein, Y., Logatchov, P., Skarbo, B., Tiunov, M.Volume:
5
Year:
2003
Language:
english
DOI:
10.1109/pac.2003.1289900
File:
PDF, 234 KB
english, 2003