[IEEE Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. 2002 - San Jose, CA, USA (12-14 March 2002)] Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings 2002 (Cat.No.02CH37311) - Thermal standards for the 21/sup st/ century
Guenin, B.M.Year:
2002
Language:
english
DOI:
10.1109/stherm.2002.991338
File:
PDF, 649 KB
english, 2002