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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - DFX of a 3rd Generation, 16-core/32-thread UltraSPARC- CMT Microprocessor
Parulkar, I., Anandakumar, S., Agarwal, G., Liu, G., Rajan, K., Chiu, F., Pendurkar, R.Year:
2008
Language:
english
DOI:
10.1109/test.2008.4700552
File:
PDF, 498 KB
english, 2008