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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Memory design for high temperature radiation environments
Tai-Hua Chen,, Clark, Lawrence T., Holbert, Keith E.Year:
2008
Language:
english
DOI:
10.1109/relphy.2008.4558870
File:
PDF, 352 KB
english, 2008