Trace-level determination and insight in speciation of...

Trace-level determination and insight in speciation of silicon in petrochemical samples by flow-injection high resolution ICP MS and HPLC-high resolution ICP MS

Pohl, Pawel, Vorapalawut, Nopparat, Bouyssiere, Brice, Lobinski, Ryszard
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Volume:
25
Year:
2010
Language:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/c005010e
File:
PDF, 262 KB
english, 2010
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