[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Accurate and efficient method of jitter and noise separation and its application to ADC testing
Xu, Li, Chen, DegangYear:
2014
Language:
english
DOI:
10.1109/vts.2014.6818743
File:
PDF, 328 KB
english, 2014