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[IEEE 2004 IEEE MTT-S International Microwave Symposium Digest - Fort Worth, TX, USA (6-11 June 2004)] 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - Extended NVNA bandwidth for long-term memory measurements
Remley, K.A., Schreurs, M.M.P., Williams, D.F., Wood, J.Year:
2004
Language:
english
DOI:
10.1109/mwsym.2004.1338931
File:
PDF, 404 KB
english, 2004