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[IEEE 2007 IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA, USA (2007.11.4-2007.11.8)] 2007 IEEE/ACM International Conference on Computer-Aided Design - A hybrid scheme for compacting test responses with unknown values
Chao, Mango C.-T., Kwang-Ting Cheng,, Seongmoon Wang,, Chakradhar, Srimat T., Wen-Long Wei,Year:
2007
Language:
english
DOI:
10.1109/iccad.2007.4397316
File:
PDF, 765 KB
english, 2007