[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - Impact of soft error challenge on SoC design
Zorian, Y., Vardanian, V.A., Aleksanyan, K., Amirkhanyan, K.Year:
2005
Language:
english
DOI:
10.1109/iolts.2005.36
File:
PDF, 88 KB
english, 2005