Reconstruction and electronic properties of silicon...

Reconstruction and electronic properties of silicon nanosheets as a function of thickness

Spencer, Michelle J. S., Morishita, Tetsuya, Snook, Ian K.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
4
Year:
2012
Language:
english
Journal:
Nanoscale
DOI:
10.1039/c2nr30100h
File:
PDF, 1.61 MB
english, 2012
Conversion to is in progress
Conversion to is failed