Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A/D Converter INL Testing With a Low-Quality Sine Wave Stimulus
Korhonen, Esa, Wegener, Carsten, Kostamovaara, JuhaVolume:
57
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/tcsi.2009.2030096
Date:
June, 2010
File:
PDF, 573 KB
english, 2010