Coping with SEUs/SETs in microprocessors by means of low-cost solutions: a comparison study
Rebaudengo, M., Reorda, M.S., Violante, M., Nicolescu, B., Velazco, R.Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2002.1039689
Date:
June, 2002
File:
PDF, 196 KB
english, 2002