[IEEE 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010 - Fort Lauderdale, FL (2010.07.25-2010.07.30)] 2010 IEEE International Symposium on Electromagnetic Compatibility - Reduction of noise in near-field measurements
Osterwise, C, Grant, S L, Beetner, DYear:
2010
Language:
english
DOI:
10.1109/isemc.2010.5711266
File:
PDF, 1.39 MB
english, 2010