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[IEEE Tenth Asian Test Symposium - Kyoto, Japan (19-21 Nov. 2001)] Proceedings 10th Asian Test Symposium - Memory read faults: taxonomy and automatic test generation
Benso, A., Di Carlo, S., Di Natale, G., Prinetto, P.Year:
2001
Language:
english
DOI:
10.1109/ats.2001.990275
File:
PDF, 470 KB
english, 2001