[IEEE 2014 IEEE 18th Workshop on Signal and Power Integrity (SPI) - Ghent, Belgium (2014.5.11-2014.5.14)] 2014 IEEE 18th Workshop on Signal and Power Integrity (SPI) - Measurements of millimeter wave test structures for high speed chip testing
De Keulenaer, Timothy, Ban, Yu, Torfs, Guy, Sercu, Stefaan, De Geest, Jan, Bauwelinck, JohanYear:
2014
Language:
english
DOI:
10.1109/SaPIW.2014.6844529
File:
PDF, 419 KB
english, 2014