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[IEEE 2013 IEEE 59th Holm Conference on Electrical Contacts (Holm 2013) - Newport, RI, USA (2013.09.22-2013.09.25)] 2013 IEEE 59th Holm Conference on Electrical Contacts (Holm 2013) - Equivalent Circuit Analysis for Transient Phenomena from Elastic Contact to Breaking Contact through Metal Melting
Kudou, Takayuki, Wakatsuki, Noboru, Takatsu, Nobuo, Hara, DaisukeYear:
2013
Language:
english
DOI:
10.1109/holm.2013.6651408
File:
PDF, 604 KB
english, 2013