[IEEE 2013 Joint IEEE Int'l Symp on Applications of Ferroelectrics & Workshop on Piezoresponse Force Microscopy (ISAF/PFM) - Prague 4, Czech Republic (2013.07.21-2013.07.25)] 2013 Joint IEEE International Symposium on Applications of Ferroelectric and Workshop on Piezoresponse Force Microscopy (ISAF/PFM) - Piezoelectric thick film sensors: Fabrication and characterization
Very, F., Combette, P., Coudouel, D., Giani, A., Rosenkrantz, E., Ferrandis, J-Y., Fourmentel, D.Year:
2013
Language:
english
DOI:
10.1109/isaf.2013.6748690
File:
PDF, 975 KB
english, 2013