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[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Characterizing the transient device behavior of SCRs by means of VFTLP waveform analysis
Wybo, Geert, Verleye, Stefaan, Van Camp, Benjamin, Marichal, OlivierYear:
2007
Language:
english
DOI:
10.1109/eosesd.2007.4401775
File:
PDF, 1.42 MB
english, 2007