Atomic force microscopy for local characterization of...

Journal of Physical Chemistry 1993 / 07 Vol. 97; Iss. 28

Atomic force microscopy for local characterization of surface acid-base properties

Lin, Xue Yun, Creuzet, Francois, Arribart, Herve
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Volume:
97
Language:
english
Journal:
The Journal of Physical Chemistry
DOI:
10.1021/j100130a025
Date:
July, 1993
File:
PDF, 564 KB
english, 1993
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