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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Detection and Diagnosis of Static Scan Cell Internal Defect
Ruifeng Guo,, Liyang Lai,, Yu Huang,, Wu-Tung Cheng,Year:
2008
Language:
english
DOI:
10.1109/TEST.2008.4700596
File:
PDF, 283 KB
english, 2008