Electrical and transient current characterization of...

IEEE Transactions on Nuclear Science 2002 / 06 Vol. 49; Iss. 3

Electrical and transient current characterization of edgeless Si detectors diced with different methods

Zheng Li,, Abreu, M., Eremin, V., Granata, V., Mariano, J., Mendes, P.R., Niinikoski, T.O., Sousa, P., Verbitskaya, E., Zhang, W.
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Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2002.1039611
Date:
June, 2002
File:
PDF, 261 KB
english, 2002
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