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[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - Unified parasitic de-embedding methodology of on-wafer multi-port device characterization
Ming-Hsiang Cho,, Guo-Wei Huang,, Chia-Sung Chiu,, Kun-Ming Chen,Year:
2005
Language:
english
DOI:
10.1109/mwsym.2005.1516919
File:
PDF, 513 KB
english, 2005