[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - A concurrent fault-detection scheme for FFT processors
Tsunoyama, M., Uenoyama, M., Kabasawa, T.Year:
1997
Language:
english
DOI:
10.1109/ats.1997.643928
File:
PDF, 499 KB
english, 1997