[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) -...

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[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - A concurrent fault-detection scheme for FFT processors

Tsunoyama, M., Uenoyama, M., Kabasawa, T.
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Year:
1997
Language:
english
DOI:
10.1109/ats.1997.643928
File:
PDF, 499 KB
english, 1997
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