[IEEE 1993 Symposium on VLSI Circuits - Kyoto, Japan (1997.06.14-1997.06.14)] Symposium on VLSI Circuits - A distributive serial multi-bit parallel test scheme for large capacity DRAMs
Sugibayashi,, Takeshima,, Naritake,, Matano,, Takada,, Aimoto,, Fujita,Year:
1993
Language:
english
DOI:
10.1109/vlsic.1993.920538
File:
PDF, 195 KB
english, 1993