[IEEE 1993 Symposium on VLSI Circuits - Kyoto, Japan...

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[IEEE 1993 Symposium on VLSI Circuits - Kyoto, Japan (1997.06.14-1997.06.14)] Symposium on VLSI Circuits - A distributive serial multi-bit parallel test scheme for large capacity DRAMs

Sugibayashi,, Takeshima,, Naritake,, Matano,, Takada,, Aimoto,, Fujita,
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Year:
1993
Language:
english
DOI:
10.1109/vlsic.1993.920538
File:
PDF, 195 KB
english, 1993
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