[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Degradation test plan for Wiener degradation processes
Baussaron, Julien, Barreau-Guerin, Mihaela, Gerville-Reache, Leo, Schimmerling, PaulYear:
2011
Language:
english
DOI:
10.1109/rams.2011.5754485
File:
PDF, 434 KB
english, 2011