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[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Electrical characterization by sub-micron probing technique on 90 nm CMOS technology for failure analysis
Giret, C., Faure, D.Year:
2004
Language:
english
DOI:
10.1109/ipfa.2004.1345621
File:
PDF, 272 KB
english, 2004