![](/img/cover-not-exists.png)
[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability Failures in Small Optocoupling and DC/DC Converter Devices
Jacob, Peter, Nicoletti, Giovanni, Rutsch, MichaelYear:
2006
Language:
english
DOI:
10.1109/ipfa.2006.251022
File:
PDF, 2.71 MB
english, 2006