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[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - A General Failure Candidate Ranking Framework for Silicon Debug
Yen, Chia-Chih, Lin, Ten, Lin, Hermes, Yang, Kai, Liu, Tayung, Hsu, Yu-ChinYear:
2008
Language:
english
DOI:
10.1109/vts.2008.60
File:
PDF, 803 KB
english, 2008