Beam test of a large area n-on-n silicon strip detector...

IEEE Transactions on Nuclear Science 1997 / 6 Vol. 44; Iss. 3

Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics

Unno, Y., Nakao, M., Fujita, K., Ciocio, A., Dane, J., Dubbs, T., Emes, J., Gilchriese, M., Grillo, A., Haber, C., Handa, T., Holland, S., Iwasaki, H., Iwata, Y., Kashigin, S., Kipnis, I., Kohriki, T.
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Volume:
44
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.603742
Date:
June, 1997
File:
PDF, 786 KB
english, 1997
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