[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Spacing impact on MOSFET mismatch
Cathignol, A., Mennillo, S., Bordez, S., Vendrame, L., Ghibaudo, G.Year:
2008
DOI:
10.1109/icmts.2008.4509320
File:
PDF, 485 KB
2008