[IEEE 2013 2nd International Symposium on Next-Generation Electronics (ISNE 2013) - Kaohsiung (2013.2.25-2013.2.26)] 2013 International Symposium on Next-Generation Electronics - The improved optoelectronic characterization in annealed Al/AZO layer after sputtering
Wen-Kuan Lin,, Yi-Chuan Wang,, Wei-Che Huang,, Ze-Syue Wu,, Ci-Sheng Cai,, Yen-Sheng Lin,, Rehbach, Werner P.Year:
2013
Language:
english
DOI:
10.1109/isne.2013.6512294
File:
PDF, 965 KB
english, 2013