A Review of Ionizing Radiation Effects in Floating Gate...

IEEE Transactions on Device and Materials Reliability 2004 / 09 Vol. 4; Iss. 3

A Review of Ionizing Radiation Effects in Floating Gate Memories

Cellere, G., Paccagnella, A.
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Volume:
4
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2004.836726
Date:
September, 2004
File:
PDF, 756 KB
english, 2004
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