[IEEE 2010 IEEE Ultrasonics Symposium (IUS) - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International Ultrasonics Symposium - Single electrode periodic buried IDT analysis using an original FEM/BEM numerical model
Ventura, Pascal, Hecht, Frederic, Dufilie, PierreYear:
2010
Language:
english
DOI:
10.1109/ultsym.2010.5935694
File:
PDF, 964 KB
english, 2010