[IEEE 12th IEEE European Test Symposium - Freiburg, Germany (2007.05.20-2007.05.24)] 12th IEEE European Test Symposium (ETS'07) - Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives
Krishnan, Shaji, Jonker, Rene, Logt, Leon van deYear:
2007
Language:
english
DOI:
10.1109/ets.2007.44
File:
PDF, 458 KB
english, 2007